Meeting wafer ID challenges

Cognex has added the In-Sight 1720 model to its family of semiconductor wafer readers. The In- Sight 1720, which joins the 1721 and 1722 models to provide semiconductor fabs and equipment with automated wafer identification, features OCR and barcode reading in a standalone package with a 752 x 480 CMOS sensor that is suitable for both new equipment and retrofits.

With the addition of the 1720, Cognex offers an range of lighting and imaging solutions to meet reading challenges for 100 percent wafer traceability. The In-Sight 1721 incorporates a high-resolution 1024 x 768 CCD specifically for 300 mm wafers with T7 Data Matrix codes, while the In-Sight 1722 includes infrared lighting for new ultra-thin oxide, nitride and polyimide wafer coatings.

Cognex says that as its fab customers move towards fully automated wafer traceability, new semiconductor processes and materials present new wafer ID challenges and, consequently, the company will continue to provide solutions that keep pace with the latest advances in wafer manufacturing technology.

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